发明名称 PROBE UNIT, AND PRODUCING METHOD AND INSPECTING METHOD OF PROBE UNIT
摘要 PROBLEM TO BE SOLVED: To provide a probe unit adjusting the position of conducting wires to electrodes using contact marks, even if the inspecting pads are not prepared in the specimen for each electrode, and also to provide an inspecting method and and a producing method of the probe unit. SOLUTION: The probe unit, which inspects the specimen equipped with electrodes and a padding for orientation positioned to the electrodes, is equipped with a substrate, conducting wires having a contact section formed on the substrate to contact with the electrode, and a mark generating section which is formed on the substrate and, by contacting with the padding for orientation in an area narrower than the contact section at the state where the contact section contacts with the electrodes, generates contact marks on the padding for orientation. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006090926(A) 申请公布日期 2006.04.06
申请号 JP20040278898 申请日期 2004.09.27
申请人 YAMAHA CORP 发明人 HATTORI ATSUO;TAKANO YASUAKI
分类号 G01R31/28;G01R1/06 主分类号 G01R31/28
代理机构 代理人
主权项
地址