发明名称 Source/drain extensions having highly activated and extremely abrupt junctions
摘要 A method for making a transistor within a semiconductor wafer. The method may include etching a recess at source/drain extension locations 90 and depositing SiGe within the recess to form SiGe source/drain extensions 90 . Dopants are implanted into the SiGe source/drain extensions 90 and the semiconductor wafer 10 is annealed. Also, a transistor source/drain region 80, 90 having a SiGe source/drain extension 90 that contains evenly distributed dopants, is highly doped, and has highly abrupt edges.
申请公布号 US2006073665(A1) 申请公布日期 2006.04.06
申请号 US20040955270 申请日期 2004.09.30
申请人 JAIN AMITABH 发明人 JAIN AMITABH
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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