| 摘要 |
PROBLEM TO BE SOLVED: To perform further development of an accurate and convenient method for testing operations of a MEMS device. SOLUTION: In one embodiment of methods and systems for testing electric characteristics of a reflective display device including an interferometric modulator display device, a controlled voltage is applied to conductive leads in the display device, and a current resulting from this application is measured. This voltage is so controlled that an interferometric modulator is not operated during resistance measurement. A method is also disclosed which conditions the interferometric modulator display device by applying a voltage waveform for operating the interferometric modulator in the display device. COPYRIGHT: (C)2006,JPO&NCIPI
|
