SEMICONDUCTOR STORAGE DEVICE AND TEST METHOD THEREFOR

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor storage device comprising a means for instantly checking of fail bit map over the whole address space. SOLUTION: The semiconductor storage device comprises any one of: a data logic forcible control circuit 21 for forcibly controlling a logic for writing or reading data to/from a memory cell selected by a specific address signal; a specific row forcible control circuit 40 for making the control to memory cells selected by a specific row address forcibly different from normal operation; and a specific column forcible control circuit 50 for making the control to memory cells selected by a specific column address forcibly different from normal operation. This forcible fail operating mode can be selected separately from the normal operating mode. COPYRIGHT: (C)2006,JPO&NCIPI