发明名称 Nonplanar transistors with metal gate electrodes
摘要 A semiconductor device comprising a semiconductor body having a top surface and a first and second laterally opposite sidewalls as formed on an insulating substrate is claimed. A gate dielectric is formed on the top surface of the semiconductor body and on the first and second laterally opposite sidewalls of the semiconductor body. A gate electrode is then formed on the gate dielectric on the top surface of the semiconductor body and adjacent to the gate dielectric on the first and second laterally opposite sidewalls of the semiconductor body. The gate electrode comprises a metal film formed directly adjacent to the gate dielectric layer. A pair of source and drain regions are then formed in the semiconductor body on opposite sides of the gate electrode.
申请公布号 US2006071275(A1) 申请公布日期 2006.04.06
申请号 US20040956279 申请日期 2004.09.30
申请人 BRASK JUSTIN K;DOYLE BRIAN S;KAVALIEROS JACK;DOCZY MARK;SHAH UDAY;CHAU ROBERT S 发明人 BRASK JUSTIN K.;DOYLE BRIAN S.;KAVALIEROS JACK;DOCZY MARK;SHAH UDAY;CHAU ROBERT S.
分类号 H01L27/12 主分类号 H01L27/12
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