发明名称 |
SUBSTRATE FOR ELECTROOPTICAL DEVICE, ELECTROOPTICAL DEVICE AND INSPECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To simply execute an inspection concerning failure detection in a substrate device for manufacturing an electrooptical device. SOLUTION: The substrate device (100) which serves as a part of a hybrid type electrooptical device is formed in each formation area on the substrate surface of the substrate for electrooptical device. Wiring (501) for inspection to which an inspection signal for inspecting the substrate device is supplied is formed in an area (200) outside each formation area so as to connect two or more image signal terminals (2a) to be electrically common. The substrate for electrooptical device is divided along a boundary (500) on the substrate surfaces of each formation area in which the substrate device is formed to separate the substrate device. COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006091239(A) |
申请公布日期 |
2006.04.06 |
申请号 |
JP20040274659 |
申请日期 |
2004.09.22 |
申请人 |
SEIKO EPSON CORP |
发明人 |
KAWADA HIROTAKA |
分类号 |
G09F9/30;G02F1/1345;G02F1/1368;G09G3/20;G09G3/36 |
主分类号 |
G09F9/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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