发明名称 SUBSTRATE FOR ELECTROOPTICAL DEVICE, ELECTROOPTICAL DEVICE AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To simply execute an inspection concerning failure detection in a substrate device for manufacturing an electrooptical device. SOLUTION: The substrate device (100) which serves as a part of a hybrid type electrooptical device is formed in each formation area on the substrate surface of the substrate for electrooptical device. Wiring (501) for inspection to which an inspection signal for inspecting the substrate device is supplied is formed in an area (200) outside each formation area so as to connect two or more image signal terminals (2a) to be electrically common. The substrate for electrooptical device is divided along a boundary (500) on the substrate surfaces of each formation area in which the substrate device is formed to separate the substrate device. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006091239(A) 申请公布日期 2006.04.06
申请号 JP20040274659 申请日期 2004.09.22
申请人 SEIKO EPSON CORP 发明人 KAWADA HIROTAKA
分类号 G09F9/30;G02F1/1345;G02F1/1368;G09G3/20;G09G3/36 主分类号 G09F9/30
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