发明名称 SEMICONDUCTOR X-RAY DETECTING ELEMENT, AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor X-ray detecting element capable of preventing a characteristic from being deteriorated under use, and a manufacturing method therefor. SOLUTION: A shade-like member 8 for preventing gas coming out from a Dewer vessel storing the semiconductor X-ray detecting element 10 from being deposited onto an i-layer 3 and a p-layer 4 is provided in the periphery of an n-face electrode 1. The semiconductor X-ray detecting element 10 is prevented from being contaminated to prevent the characteristic from being deteriorated, by the present invention, since the gas coming out from the Dewer vessel is deposited onto the shade-like member 8 before reaching the i-layer 3 and the p-layer 4 of the semiconductor X-ray detecting element. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006090798(A) 申请公布日期 2006.04.06
申请号 JP20040275374 申请日期 2004.09.22
申请人 SHIMADZU CORP 发明人 YAMADA MINORU
分类号 G01T7/00;G01T1/24;H01L31/09 主分类号 G01T7/00
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