发明名称 |
Pattern identification and bit level measurements on repetitive patterns |
摘要 |
A method of pattern identification and bit level measurements for a high speed digital signal using an oscilloscope converts an input waveform into a bit stream sequence. From the bit stream sequence pre-defined patterns are identified and overlaid on each other to form a superimposed pattern. A center region for each bit of the superimposed pattern is identified, and appropriate voltage measurements within the respective center regions are taken for the bit levels.
|
申请公布号 |
EP1643258(A1) |
申请公布日期 |
2006.04.05 |
申请号 |
EP20050255893 |
申请日期 |
2005.09.22 |
申请人 |
TEKTRONIX, INC. |
发明人 |
KAYAL, SAUMITRA;AJGAONKAR, OF, MANISHA |
分类号 |
G01R31/317 |
主分类号 |
G01R31/317 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|