发明名称 Pattern identification and bit level measurements on repetitive patterns
摘要 A method of pattern identification and bit level measurements for a high speed digital signal using an oscilloscope converts an input waveform into a bit stream sequence. From the bit stream sequence pre-defined patterns are identified and overlaid on each other to form a superimposed pattern. A center region for each bit of the superimposed pattern is identified, and appropriate voltage measurements within the respective center regions are taken for the bit levels.
申请公布号 EP1643258(A1) 申请公布日期 2006.04.05
申请号 EP20050255893 申请日期 2005.09.22
申请人 TEKTRONIX, INC. 发明人 KAYAL, SAUMITRA;AJGAONKAR, OF, MANISHA
分类号 G01R31/317 主分类号 G01R31/317
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