发明名称 Atomic force microscope
摘要 <p>An apparatus includes a sample stage, a cantilever mount, a cantilever-force detector, a cantilever feedback system, and a sample stage feedback system. The sample stage is configured for holding a sample. The cantilever mount is configured for mechanically fixing a mechanical cantilever having a scanning tip. The cantilever-force detector is configured to produce an electrical cantilever-force error signal. The cantilever feedback system is configured to electromechanically drive the mechanical cantilever in a manner responsive to the cantilever-force error signal. The sample stage feedback system is configured to electromechanically displace the sample stage in a manner responsive to the cantilever-force error signal. The cantilever feedback system and the sample stage feedback system are connected to receive the cantilever-force error signal in parallel.</p>
申请公布号 EP1643510(A1) 申请公布日期 2006.04.05
申请号 EP20050255866 申请日期 2005.09.22
申请人 LUCENT TECHNOLOGIES INC. 发明人 BLUMBERG, GIRSH;SCHLOCKERMANN, CARL JOHANNES
分类号 G01Q10/06 主分类号 G01Q10/06
代理机构 代理人
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