| 摘要 |
An design architecture for an application specific integrated circuit (ASIC) is disclosed. The design architecture of the ASIC includes a pre-determined number of redundant computational units such that when defective computational units are found during testing, full functionality of the ASIC is maintained by re-mapping functionality from the defective units to the once redundant units. The marking of defective units and the re-mapping of functionality are automated by using self-test logic built into each computational unit in the ASIC. The self-test logic is adapted to allow the corresponding computational unit to self-isolate itself from the data initialization process and to self-disable to avoid any computation when the ASIC is in operation mode. The re-mapping of functionality is achieved by initializing the computational units in the array in a serial manner. |
