发明名称 |
Method of removing a via fence |
摘要 |
A method of fabricating a dual damascene structure includes etching a via through a first dielectric layer above a substrate, a barrier layer on the first dielectric layer, and a second dielectric layer on the barrier layer. The via is at least partially filled with a photoresist plug. The plug is etched back. A trench is etched through the second dielectric layer. The trench is aligned with the via. The substrate having the first and second dielectric layers thereon is wet with an acid for a sufficient length of time to remove a via fence formed in the trench. The via and the trench are filled with metal.
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申请公布号 |
US7021320(B2) |
申请公布日期 |
2006.04.04 |
申请号 |
US20030411799 |
申请日期 |
2003.04.11 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LEE CHOU-FENG |
分类号 |
H01L21/302;H01L21/311;H01L21/768 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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