Semiconductor device and method of inspecting the same

摘要

A semiconductor chip is provided with a phase comparison circuit ( 1 ), in addition to an integrated circuit implementing a normal operation. The phase comparison circuit ( 1 ) compares phases between an internal signal (A) of the integrated circuit and an external signal and outputs a monitor signal (MONSIG) expressing the result of this comparison outward from the semiconductor chip. Thus, the phase of the internal signal (A) of the integrated circuit can be directly detected.