发明名称 Method of forming a conductive contact
摘要 In one implementation, an etching process includes forming a carbon containing material over a substrate and plasma etching at a temperature of at least 400° C. using a hydrogen or oxygen containing plasma. In one implementation, a plasma etching process includes forming openings in a masking layer over a substrate and etching material beneath the masking through the openings. The masking layer is removed and the substrate is plasma etched at a temperature of at least 400° C. In one implementation, an etching process includes forming a residue over the substrate during a first etching and subsequently plasma etching to remove the residue. In one implementation, a chemical vapor deposition process includes positioning a semiconductor substrate within a plasma enhanced chemical vapor deposition reactor, plasma etching using a first gas chemistry, depositing a material over the substrate within the reactor using a second gas chemistry.
申请公布号 US7022618(B2) 申请公布日期 2006.04.04
申请号 US20030664739 申请日期 2003.09.18
申请人 MICRON TECHNOLOGY, INC. 发明人 SHARAN SUJIT;SANDHU GURTEJ S.;BLALOCK GUY T.
分类号 H01L21/461;H01L21/285;H01L21/302;H01L21/306;H01L21/3065;H01L21/308;H01L21/44;H01L21/768 主分类号 H01L21/461
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