发明名称 Verfahren zur Strukturierung eines Resists
摘要 A process for structuring a resist for field effect transistor gates uses a base mask to leave unexposed regions of the resist as lines (102a,104a,106a) followed by a trimming mask (116) having transparent auxiliary structures (118,120) between the lines. A process for structuring a resist having removable exposed regions and whose unexposed regions define neighboring lines (102a,104a,106a) comprises illuminating through a base mask having transmissive regions (108,110,112,114)along either side of the lines and then through a trimmer mask (116) having a transparent auxiliary structure (118,120) between the lines and extending to their ends.
申请公布号 DE10118409(B4) 申请公布日期 2006.03.30
申请号 DE2001118409 申请日期 2001.04.12
申请人 INFINEON TECHNOLOGIES AG 发明人 AHRENS, MARCO;LUDWIG, BURKHARD;HUG, MARCO
分类号 G03F7/20;G03F1/00;H01L21/312 主分类号 G03F7/20
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