发明名称 METHOD AND DEVICE FOR WASHING SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To enable uniform treatment in the surface of a semiconductor substrate by devising supply of treatment liquid. SOLUTION: The flow rate of a flow rate adjusting valve is made larger gradually than the flow rate by a pump until a liquid level reaches a lower limit position LL, and the flow rate of the flow rate adjusting valve is made smaller gradually than the flow rate of the pump until the liquid level attains to an upper limit position. The liquid level of the treatment liquid stored in an inner vessel 3 is moved up and down by adjusting each part in this way. Since the liquid level moves up and down along the surface of a semiconductor substrate W, in-plane uniformity of the semiconductor substrate W is further improved in treatment. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006086409(A) 申请公布日期 2006.03.30
申请号 JP20040271165 申请日期 2004.09.17
申请人 SEIKO EPSON CORP;TOSHIBA CORP;DAINIPPON SCREEN MFG CO LTD 发明人 NAKAJIMA TOSHIKI;MATSUO HIROYUKI;MIYAZAKI KUNIHIRO;HIGUCHI TAKASHI
分类号 H01L21/304 主分类号 H01L21/304
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