发明名称 Method and system for testing memory using hash algorithm
摘要 A method for testing a memory is described. The method includes the following steps. First, a test pattern is generated by a hash algorithm. Then, the test pattern is written into the memory. Next, the test pattern is read from the memory. Following that, a signature is generated by the hash algorithm using the test pattern read from the memory. Subsequently, the memory is verified by comparing the signature to a reference signature.
申请公布号 US2006069966(A1) 申请公布日期 2006.03.30
申请号 US20040951664 申请日期 2004.09.29
申请人 LIU YEN-FU 发明人 LIU YEN-FU
分类号 G11C29/00 主分类号 G11C29/00
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