发明名称 MAGNETORESISTANCE MEMORY DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a magnetoresistance memory device, capable of improving an yield, and to provide the manufacturing method of the same. SOLUTION: A TMR element 60a is constituted of a pin layer 65 composed of a magnetic film, a tunnel insulating layer 66 composed of a non-magnetic insulating film, and a free layer 67 composed of the magnetic film. The TMR element 60a is provided with a side etch structure having a cut-in formed on the side wall of the tunnel insulating layer 66 in the pin layer 65, the tunnel layer 66, and the free layer 67 having the same plane configuration respectively. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006086322(A) 申请公布日期 2006.03.30
申请号 JP20040269273 申请日期 2004.09.16
申请人 RENESAS TECHNOLOGY CORP 发明人 FURUTA HARUO;UENO SHUICHI;KUROIWA TAKEHARU
分类号 H01L27/105;H01L21/306;H01L21/3065;H01L21/8246;H01L43/08;H01L43/12 主分类号 H01L27/105
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