发明名称 |
SEMICONDUCTOR WAFER POLISHING DEVICE AND METHOD FOR POLISHING USING SAME |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor wafer polishing device that is constituted to effectively prevent a semiconductor wafer from being contaminated with a heavy metal in a mirror polishing step, and to provide a method for polishing using the device. <P>SOLUTION: The semiconductor wafer polishing device which polishes the semiconductor wafer is provided with a polishing device main body having a rotatable pedestal and an abrasive slurry tank which stores abrasive slurry containing a chelate agent and supplied onto the pedestal through an abrasive slurry supplying device. The abrasive slurry supplying device is provided with a device which removes heavy metal chelate anions contained in the abrasive slurry and a chelate agent supplying device after the removing device. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
申请公布号 |
JP2006086144(A) |
申请公布日期 |
2006.03.30 |
申请号 |
JP20040266179 |
申请日期 |
2004.09.14 |
申请人 |
NIPPON CHEM IND CO LTD |
发明人 |
MAEJIMA KUNIAKI;MIYABE SHINSUKE;IZUMI MASAHIRO |
分类号 |
H01L21/304;B24B37/00;B24B57/02 |
主分类号 |
H01L21/304 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|