发明名称 SEMICONDUCTOR WAFER POLISHING DEVICE AND METHOD FOR POLISHING USING SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor wafer polishing device that is constituted to effectively prevent a semiconductor wafer from being contaminated with a heavy metal in a mirror polishing step, and to provide a method for polishing using the device. <P>SOLUTION: The semiconductor wafer polishing device which polishes the semiconductor wafer is provided with a polishing device main body having a rotatable pedestal and an abrasive slurry tank which stores abrasive slurry containing a chelate agent and supplied onto the pedestal through an abrasive slurry supplying device. The abrasive slurry supplying device is provided with a device which removes heavy metal chelate anions contained in the abrasive slurry and a chelate agent supplying device after the removing device. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006086144(A) 申请公布日期 2006.03.30
申请号 JP20040266179 申请日期 2004.09.14
申请人 NIPPON CHEM IND CO LTD 发明人 MAEJIMA KUNIAKI;MIYABE SHINSUKE;IZUMI MASAHIRO
分类号 H01L21/304;B24B37/00;B24B57/02 主分类号 H01L21/304
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