发明名称 VARYING FEATURE SIZE IN RESIST
摘要 A method for creating a pattern on a substrate, the method includes the steps of imprinting a first pattern on the substrate; and imprinting a second substantially similar pattern which is mis-registered with regard to the first pattern so that the combination of the first and second patterns cause a systematic variation in a final size of defined elements across the substrate.
申请公布号 WO2005047976(A3) 申请公布日期 2006.03.30
申请号 WO2004US37354 申请日期 2004.11.09
申请人 EASTMAN KODAK COMPANY;FABINSKI, ROBERT, PIERRE;SUMMA, JOSEPH, R. 发明人 FABINSKI, ROBERT, PIERRE;SUMMA, JOSEPH, R.
分类号 G03F1/14;G03F7/00;G03F7/20 主分类号 G03F1/14
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