X-RAY LAMINOGRAPHY INSPECTION SYSTEM AND METHOD

摘要

For inspecting a structure with non-destructive x-ray laminography inspection, probes are magnetically coupled to opposing surfaces of the structure. The probes include an x-ray source and an x­-ray detector which are driven to obtain inspection data that facilitates x-ray laminographic inspection of the structure. A device may be autonomous with a feedback-controlled motor and/or a positional encoder for translation of the probes. A device may include wireless operation. A display may be included to provide real-time visual images of the x-ray laminography or position information.