| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of producing data for inspecting a packaging substrate which can easily produce the data for inspecting which can obtain an inspection result of high reliability, and to provide a method and an apparatus of inspecting the packaging substrate. <P>SOLUTION: A plurality of mounting data each for specifying the carrying position data of one or a plurality of electronic parts in a mounting data coordinate system and a plurality of arrangement data for specifying the origin position of the mounting data coordinate system on the packaging substrate can be set to the data for inspecting. Thereby, arrangement of one or a plurality of electronic components is set by the mounting data, and the arrangement set in this manner is rearranged by arrangement data on the substrate, and thereby, it can flexibly deal with the arrangement of the various electronic components. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
