| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device capable of checking preliminarily the classification of each I/O cell on board at an inspection step of logic functions and operating characteristics before producing or before shipping of the semiconductor integrated circuit device. SOLUTION: In the semiconductor integrated circuit loading a plurality of I/O cells, which is equipped with a cell discrimination information holding section, installed in each I/O cell, holding cell discrimination information to discriminate the I/O cell and a control section, which is installed in the semiconductor integrated circuit and, according to the controlling signals inputted from exterior, outputing cell discrimination information of that I/O cell to the discrimination information holding section of each I/O cell, pin number information is inputted from exterior using an external simulator or tester, cell discrimination information is retrieved from the discrimination information holding section of each I/O cell, and thus correspondence with pin number information can be identified. COPYRIGHT: (C)2006,JPO&NCIPI
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