| 摘要 |
PROBLEM TO BE SOLVED: To provide a material defect detecting method and device for detecting a fine defect existing inside a material and evaluating the material quality using the detection result. SOLUTION: The material defect detecting device comprises a burst ultrasonic generator 1, a transmitting/receiving probe 2 scannable in two axial directions, an amplifier 3, a receiver 4, and a computer 5. The device K where the computer 5 comprises a frequency analysis means 51 and an evaluation processing means 52 scans and radiates burst supersonic wave to an end face to be inspected, receives reflected wave or transmitted wave of the radiated burst supersonic wave, records all received waveforms, calculates intensities of the fundamental wave and harmonic signal by analyzing frequency of all recorded waveforms, and evaluates the inspected object based on the calculated intensities of the fundamental wave and harmonic signal. COPYRIGHT: (C)2006,JPO&NCIPI
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