TEST SIMULATOR, TEST SIMULATION PROGRAM AND RECORDING MEDIUM

摘要

A test simulator is provided for simulating a semiconductor device test. The test simulator is provided with a test pattern holding means for holding an existing test pattern to be given to a semiconductor device; a device output holding means for previously holding an output to be obtained from the semiconductor device when the existing test pattern is given; a test pattern generating means for generating a new test pattern to be given to the semiconductor device; a test pattern judging means for judging whether the new test pattern is the same as the existing test pattern; and a simulation skipping means for skipping at least a part of a simulation test by reading out the output from the device output holding means without giving the new test pattern to the semiconductor device when the test patterns are same and by permitting the read out output to be an output for the new test pattern.