发明名称 TRANSMISSION ELECTRON MICROSCOPY SAMPLE PREPARATION METHOD FOR ELECTRON HOLOGRAPHY
摘要 A method for preparing a transmission electron microscopy (TEM) sample for electron holography includes forming a sacrificial material over an area of interest on the sample, and polishing the sample to a desired thickness, wherein the area of interest is protected from rounding during the polishing. The sacrificial material is removed from the sample following the polishing.
申请公布号 US2006065830(A1) 申请公布日期 2006.03.30
申请号 US20040711690 申请日期 2004.09.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BAUER THOMAS A.;BOETTCHER STEVEN H.;DOMENICUCCI ANTHONY G.;GAUDIELLO JOHN G.;KIMBALL LEON J.;MCMURRAY JEFFREY S.;WANG YUN-YU
分类号 G01N1/32;G01N23/04 主分类号 G01N1/32
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