发明名称 |
PMT-based pattern matching calibration for gamma camera using non-uniform pinhole aperture grid mask |
摘要 |
Point source responses of pinhole apertures in a non-uniform grid mask used to spatially calibrate a gamma camera can be modeled as a two-dimensional Gaussian model function. Pinhole data from each pinhole location are added together to generate a complete Gaussian model of the flood image from the mask. The Gaussian model then is subjected to global and PMT-based pattern matching with an actual input flood image obtained using the mask, to obtain a transformed Gaussian model that is more accurately aligned with actual pinhole locations of the mask. The transformed Gaussian model then can be used in a peak detection process for calibration images, which are used to develop LC coefficients for the camera.
|
申请公布号 |
US2006065826(A1) |
申请公布日期 |
2006.03.30 |
申请号 |
US20050237427 |
申请日期 |
2005.09.28 |
申请人 |
WANG SHARON X;MALMIN RONALD E |
发明人 |
WANG SHARON X.;MALMIN RONALD E. |
分类号 |
G01D18/00;G01T1/00 |
主分类号 |
G01D18/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|