发明名称 PMT-based pattern matching calibration for gamma camera using non-uniform pinhole aperture grid mask
摘要 Point source responses of pinhole apertures in a non-uniform grid mask used to spatially calibrate a gamma camera can be modeled as a two-dimensional Gaussian model function. Pinhole data from each pinhole location are added together to generate a complete Gaussian model of the flood image from the mask. The Gaussian model then is subjected to global and PMT-based pattern matching with an actual input flood image obtained using the mask, to obtain a transformed Gaussian model that is more accurately aligned with actual pinhole locations of the mask. The transformed Gaussian model then can be used in a peak detection process for calibration images, which are used to develop LC coefficients for the camera.
申请公布号 US2006065826(A1) 申请公布日期 2006.03.30
申请号 US20050237427 申请日期 2005.09.28
申请人 WANG SHARON X;MALMIN RONALD E 发明人 WANG SHARON X.;MALMIN RONALD E.
分类号 G01D18/00;G01T1/00 主分类号 G01D18/00
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