| 发明名称 |
ELECTRO-OPTICAL MEASUREMENT OF HYSTERESIS IN INTERFEROMETRIC MODULATORS. |
| 摘要 |
Disclosed herein are methods and apparatus for testing interferometric modulators. The interferometric modulators may be tested by applying a time-varying voltage stimulus (100) and measuring the resulting reflectivity (102) from the modulators.
|
| 申请公布号 |
MXPA05010241(A) |
申请公布日期 |
2006.03.29 |
| 申请号 |
MX2005PA10241 |
申请日期 |
2005.09.23 |
| 申请人 |
IDC, LLC. |
发明人 |
WILLIAM J. CUMMINGS |
| 分类号 |
G01B9/02;(IPC1-7):G01B9/02 |
主分类号 |
G01B9/02 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
