| 摘要 |
The invention relates to a device and a method for analysing a sample plate on which at least two material samples are arranged. According to said method, an impedance spectrum is measured for each material sample, and a structure of a switching circuit equivalent comprising at least one electronic component is then determined according to the respectively measured impedance spectrum. Starting values for the components of the respective switching circuit equivalent are determined for an error minimising calculation. During the error minimising calculation, a theoretical impedance spectrum for at least one of the material samples is calculated on the basis of the impedance spectrum measured for the material sample, the starting values for the components of the corresponding switching circuit equivalent, and fit values for the components of the corresponding switching circuit equivalent. A validation variable is then determined for the calculated theoretical impedance spectrum, and an evaluation variable is determined by comparing at least one of the fit values for the components with reference value. |
