发明名称 Method for improving the uniformity and reducing the roughness of a silicon surface before dielectric layer formation
摘要 The instant invention is a method for forming a smooth interface between the upper surface of a silicon substrate and a dielectric layer. The invention comprises forming a thin amorphous region (180) on the upper surface (170) of a silicon substrate prior to forming the dielectric layer on the upper silicon surface.
申请公布号 EP1205966(A3) 申请公布日期 2006.03.29
申请号 EP20010000615 申请日期 2001.11.09
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 ROTONDARO, ANTONIO L. P.
分类号 H01L21/306;H01L29/78;H01L21/28;H01L21/302;H01L21/31;H01L21/316;H01L21/318;H01L21/469;H01L29/51 主分类号 H01L21/306
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