发明名称 Method for implanting atomic species through an uneven surface of a semiconductor layer
摘要 A method for implanting atomic species through an uneven surface of a semiconductor layer. The technique includes applying a covering layer upon the uneven surface in an amount sufficient and in a manner to increase surface uniformity. The method also includes implanting atomic species through the covering layer and uneven surface to obtain a more uniform depth of implantation of the atomic species in the layer.
申请公布号 US7018913(B2) 申请公布日期 2006.03.28
申请号 US20040840599 申请日期 2004.05.05
申请人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES S.A. 发明人 GHYSELEN BRUNO;AKATSU TAKESHI
分类号 H01L21/20;H01L21/265;H01L21/36;H01L21/762 主分类号 H01L21/20
代理机构 代理人
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