发明名称 Impedance monitoring system and method
摘要 An apparatus ( 14 ) for and method of measuring impedance in a capacitively coupled plasma reactor system ( 10 ). The apparatus includes a high-frequency RF source ( 150 ) in electrical communication with an upper electrode ( 50 ). A first high-pass filter ( 130 ) is arranged between the upper electrode and the high-frequency RF source, to block low-frequency, high-voltage signals from the electrode RF power source ( 66 ) from passing through to the impedance measuring circuit A current-voltage probe ( 140 ) is arranged between the high-frequency source and the high-pass filter, and is used to measure the current and voltage of the probe signal with and without the plasma present. An amplifier ( 250 ) is electrically connected to the current-voltage probe, and a data acquisition unit ( 260 ) is electrically connected to the amplifier. A second high-pass filter ( 276 ) is electrically connected to a lower electrode ( 56 ) and to ground, so as to complete the isolation of the high-frequency circuit of the impedance measurement apparatus from the low-frequency, high-voltage circuit of the capacitively coupled plasma reactor system. A method of measuring the plasma impedance using the apparatus of the present invention is also disclosed.
申请公布号 US7019543(B2) 申请公布日期 2006.03.28
申请号 US20040469986 申请日期 2004.02.17
申请人 TOKYO ELECTRON LIMITED 发明人 QUON BILL H.
分类号 G01R27/08;H05H1/00;G01N27/62;G01R19/00;G01R27/26;H01J37/32;H05H1/46 主分类号 G01R27/08
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