发明名称 Single polisilicon emitter bipolar junction transistor processing technique using cumulative photo resist application and patterning
摘要 A process for forming a bipolar transistor where the doping implantation of the extrinsic base regions does not affect the emitter doping levels. The techniques is to not remove the photoresist layer used to define the poly emitter contact. The photoresist layer for defining the extrinsic base regions overlays the photoresist layer over the emitter poly. When the base photoresist is processed to expose the base regions the photoresist over the emitter poly remains in tact. In this arrangement the base implantation is prevented from driving through the emitter poly and affecting the doping levels in the emitter.
申请公布号 US7018778(B1) 申请公布日期 2006.03.28
申请号 US20030395499 申请日期 2003.03.24
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 LEIBIGER STEVEN M.;SZENDREI LAURENCE M.;DOYLE MARK A.
分类号 G03F7/26 主分类号 G03F7/26
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