发明名称 Siloxane-based resin and method for forming insulating film between interconnect layers in semiconductor devices by using the same
摘要 Disclosed herein are siloxane-based resins prepared by hydrolyzing and polycondensing cyclic and/or cage-shape siloxane compounds, optionally with at least one silane compound, in an organic solvent in the presence of a catalyst and water. Also, disclosed herein are methods for forming insulating film between interconnect layers in semiconductor devices by using the siloxane-based resins thus prepared as low dielectric insulating materials.
申请公布号 US7019099(B2) 申请公布日期 2006.03.28
申请号 US20030621380 申请日期 2003.07.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LYU YI YEOL;YIM JIN HEONG;MAH SANG KOOK;NAH EUN JU;HWANG IL SUN;JEONG HYUN DAM;KIM JUNG HYUNG
分类号 C08G77/18;C08G77/04;C08G77/50;H01B3/46;H01L21/312;H01L21/316 主分类号 C08G77/18
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