发明名称 MASK PATTERN FOR MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE HAVING FINE PATTERNS
摘要 <p>Methods of forming an integrated circuit device may include forming a resist pattern on a layer of an integrated circuit device with portions of the layer being exposed through openings of the resist pattern. An organic-inorganic hybrid siloxane network film may be formed on the resist pattern. Portions of the layer exposed through the resist pattern and the organic-inorganic hybrid siloxane network film may then be removed. Related structures are also discussed.</p>
申请公布号 KR20060027523(A) 申请公布日期 2006.03.28
申请号 KR20040076349 申请日期 2004.09.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAH, JUNG HWAN;KIM, HYUN WOO;HATA MITSUHIRO;WOO, SANG GYUN
分类号 H01L21/027;G03F1/70;G03F1/80;G03F7/40 主分类号 H01L21/027
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