发明名称 Low voltage non-volatile memory cells using twin bit line current sensing
摘要 A non-volatile memory cell operating at low voltage by means of impact ionization for programming. Impact ionization arises from a charge injector, such as a diode, created in the substrate of a floating gate charge storage transistor. The charge supply is biased by push-pull voltages applied to the charge storage transistor, while another floating gate transistor assists in reading the charge state of the charge storage transistor. The other transistor switches current from a sense transistor associated with a sense line, the current switching between two bit lines depending on the charge state of the charge storage transistor. In other words, the switched current appears in one of two bit lines, one bit line indicating stored charge and the other indicating the absence of stored charge, i.e. digital zero and one, positively indicated in the two bit lines.
申请公布号 US7020020(B1) 申请公布日期 2006.03.28
申请号 US20040946728 申请日期 2004.09.21
申请人 ATMEL CORPORATION 发明人 LOJEK BOHUMIL
分类号 G11C16/04 主分类号 G11C16/04
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