| 摘要 |
FIELD: non-destructive inspection methods. ^ SUBSTANCE: device has X-ray radiation source, two radiation detectors disposed at both sides of inspected sample, and processing circuit. Device also has contact-free temperature detector and processor, which has one input connected with output of processing circuit. The other output of processor is connected with output of temperature detector. ^ EFFECT: improved precision of measurement. ^ 1 dwg |
