FREE DROP TYPE IMPACT TESTING DEVICE,申请号KR20040075525-传众专利搜索

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发明名称	FREE DROP TYPE IMPACT TESTING DEVICE
摘要
申请公布号	KR20060026692(A)	申请公布日期	2006.03.24
申请号	KR20040075525	申请日期	2004.09.21
申请人	KOREA INSTITUTE OF MACHINERY & MATERIALS	发明人	KIM, WAN DOO;KIM, DONG JIN
分类号	G01N3/30	主分类号	G01N3/30
代理机构		代理人
主权项
地址

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