发明名称 QUALITY EVALUATION METHOD AND TESTING APPARATUS OF SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a reliable quality evaluation method and testing apparatus of a substrate which has an improved accuracy of detection of the deviation of the center of a through-hole from the center of a pad by finding the coordinates of the center of the pad accurately in a short time. SOLUTION: Light is irradiated on the front or rear surface of a substrate 1 to image the through-hole 4 formed in the substrate 1. Based on the obtained imaging data, the coordinates of the center P of the through-hole 4 is found. Then, light is radiated on the front and rear surfaces of the substrate 1 to image the pad 3 formed on the front surface of the substrate 1. Based on the obtained imaging data, the coordinates of the center O of the pad 3 is found. The deviationδof the center P of the through-hole from the center O of the pad is calculated for each pad 3. If the calculated deviationδis within an allowable value for every pad 3, it is acceptable. If any one of the calculated deviationδis out of the allowable value, it is not acceptable. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006080216(A) 申请公布日期 2006.03.23
申请号 JP20040261188 申请日期 2004.09.08
申请人 HITACHI VIA MECHANICS LTD 发明人 UEHARA MASASHI;YAMAYA MASATOSHI
分类号 H05K3/00;G01B11/00;H05K3/46 主分类号 H05K3/00
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