发明名称 APPLICATION/DEVELOPING DEVICE, EXPOSURE DEVICE AND RESIST PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an application/developing device for removing particles stuck to a peripheral edge part of a semiconductor wafer (including removal of a water-repellent protection film used for repelling liquid at the time of liquid immersion exposure) with a simple structure after liquid immersion exposure and before development. SOLUTION: A cleaning unit is arranged in an interface station of the application/developing device. The cleaning unit sandwiches a peripheral part of the wafer by a U-shaped part formed to surround the peripheral edge part of the wafer, discharges cleaning liquid to the peripheral edge part of the wafer from an upper side nozzle part and a lower side nozzle part, which are disposed in the U-shaped part and sucks it from a suction port on a side part of the U-shaped part. Thus, the particles stuck to the wafer are securely removed with such structure. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006080404(A) 申请公布日期 2006.03.23
申请号 JP20040264755 申请日期 2004.09.10
申请人 TOKYO ELECTRON LTD 发明人 YAMAMOTO TARO;HIRAKAWA OSAMU
分类号 H01L21/027 主分类号 H01L21/027
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