发明名称 STENCIL MASK AND ITS MANUFACTURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a stencil mask which is easily made thin and easily subjected to stress control and which has high processing property, high strength of the film, high pattern accuracy and excellent electron beam irradiation characteristics, and also to provide a method for manufacturing the mask. <P>SOLUTION: The mask comprises a substrate, and a mask base supported by the substrate and having a transmissive hole pattern where a charge particle beam passes. The mask base consists of a diamond film containing nitrogen by≥3×10<SP>18</SP>cm<SP>-3</SP>. The diamond film is deposited by a plasma CVD method using a source material gas containing hydrocarbon, hydrogen and≥0.5% nitrogen source gas. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006078856(A) 申请公布日期 2006.03.23
申请号 JP20040263909 申请日期 2004.09.10
申请人 TOPPAN PRINTING CO LTD 发明人 GAMO SHUSUKE;FUKUGAMI NORIHITO;TAMURA AKIRA
分类号 C23C16/511;G03F1/20 主分类号 C23C16/511
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