发明名称 |
Deposition of TiN films in a batch reactor |
摘要 |
Titanium nitride (TiN) films are formed in a batch reactor using titanium chloride (TiCl<SUB>4</SUB>) and ammonia (NH<SUB>3</SUB>) as precursors. The TiCl<SUB>4 </SUB>is flowed into the reactor in temporally separated pulses. The NH<SUB>3 </SUB>can also be flowed into the reactor in temporally spaced pulses which alternate with the TiCl<SUB>4 </SUB>pulses, or the NH<SUB>3 </SUB>can be flowed continuously into the reactor while the TiCl<SUB>4 </SUB>is introduced in pulses. The resulting TiN films exhibit low resistivity and good uniformity.
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申请公布号 |
US2006060137(A1) |
申请公布日期 |
2006.03.23 |
申请号 |
US20050096861 |
申请日期 |
2005.03.31 |
申请人 |
HASPER ALBERT;SNIJDERS GERT-JAN;VANDEZANDE LIEVE;DE BLANK MARINUS J;BANKRAS RADKO G |
发明人 |
HASPER ALBERT;SNIJDERS GERT-JAN;VANDEZANDE LIEVE;DE BLANK MARINUS J.;BANKRAS RADKO G. |
分类号 |
C23C16/00 |
主分类号 |
C23C16/00 |
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