发明名称 Deposition of TiN films in a batch reactor
摘要 Titanium nitride (TiN) films are formed in a batch reactor using titanium chloride (TiCl<SUB>4</SUB>) and ammonia (NH<SUB>3</SUB>) as precursors. The TiCl<SUB>4 </SUB>is flowed into the reactor in temporally separated pulses. The NH<SUB>3 </SUB>can also be flowed into the reactor in temporally spaced pulses which alternate with the TiCl<SUB>4 </SUB>pulses, or the NH<SUB>3 </SUB>can be flowed continuously into the reactor while the TiCl<SUB>4 </SUB>is introduced in pulses. The resulting TiN films exhibit low resistivity and good uniformity.
申请公布号 US2006060137(A1) 申请公布日期 2006.03.23
申请号 US20050096861 申请日期 2005.03.31
申请人 HASPER ALBERT;SNIJDERS GERT-JAN;VANDEZANDE LIEVE;DE BLANK MARINUS J;BANKRAS RADKO G 发明人 HASPER ALBERT;SNIJDERS GERT-JAN;VANDEZANDE LIEVE;DE BLANK MARINUS J.;BANKRAS RADKO G.
分类号 C23C16/00 主分类号 C23C16/00
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