发明名称 ULTRASONIC FLAW DETECTION METHOD AND EQUIPMENT FOR DETECTING FLAW OF FUNCTIONAL DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an ultrasonic flaw detection method capable of detecting a flaw of a thin plate-shaped specimen in a shorter time by using fewer probes. SOLUTION: This ultrasonic flaw detection method for detecting a flaw of a specimen 13 is characterized as follows: The thin plate-shaped specimen 13 having end faces 13a, 13b is held in liquid, and an ultrasonic wave is projected to the end faces 13a, 13b by fixed probes 15, 17, and a reflected wave from the specimen 13 is received as a received wave. Then, waveform data of the received wave are compared with reference waveform data, to thereby determine existence of a flaw of the specimen 13. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006078208(A) 申请公布日期 2006.03.23
申请号 JP20040259652 申请日期 2004.09.07
申请人 U-TEC KK 发明人 NAKAZAWA IKUO;NAKAYA KOICHI;MIYAZAWA ZEN
分类号 G01N29/04 主分类号 G01N29/04
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