发明名称 Multi-bit stacked-type non-volatile memory and manufacture method thereof
摘要 The present invention discloses a multi-bit stacked-type non-volatile memory having a spacer-shaped floating gate and a manufacturing method thereof. The manufacturing method includes forming a patterned dielectric layer containing arsenic on a semiconductor substrate, wherein the patterned dielectric layer defines an opening as an active area. A dielectric spacer is formed on a side wall of the patterned dielectric layer and a gate dielectric layer is formed on the semiconductor substrate. A source/drain region is formed by thermal driving method making arsenic diffusion from the patterned dielectric layer into the semiconductor substrate. A spacer-shaped floating gate is formed on the side wall of the dielectric spacer and the gate dielectric layer. An interlayer dielectric layer is formed on the spacer-shaped floating gate. A control gate is formed on the interlayer dielectric layer and fills the opening of the active area.
申请公布号 US2006063339(A1) 申请公布日期 2006.03.23
申请号 US20050269671 申请日期 2005.11.09
申请人 NANYA TECHNOLOGY CORPORATION 发明人 HSIAO CHING-NAN;LIN CHI-HUI;CHUANG YING-CHENG
分类号 H01L21/331;H01L21/28;H01L21/336;H01L21/82;H01L21/8222;H01L21/8242;H01L27/115;H01L29/788 主分类号 H01L21/331
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