| 摘要 |
Puncture sequences S1, S2, etc. for code rates R1, R2, etc. less than a maximum code rate Rmax are defined subsets of a maximum rate puncture sequence Smax that corresponds to the maximum code rate Rmax. Each puncture sequence Si for a code rate Ri is related to the puncture sequence Si-1 of the previous code rate Ri-1 and preferably S1⊆S2⊆S3⊆...⊆Smax-1⊆Smax. The puncture sequences are groups of one or more memory elements, each of which is a variable degree, a variable node location, a check degree, or a check node location. A method for deriving such a puncture sequence for variable code rates is also disclosed.
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