Method for testing of an integrated circuit

摘要

The method involves using a logical module (3). Part (7) of the logic (5) of the integrated circuit (1) is replaced by the logical module in a test mode. The test module fills a test chain (for a scan test) with test patterns (13) and delivers a test result (15). The logical module is preferably arranged on the semiconductor substrate on which the integrated circuit is arranged. Independent claims are included for a logical module; and integrated circuit; a circuit arrangement; and a computer program.