发明名称 Method of forming a thin film transistor by utilizing a laser crystallization process
摘要 An amorphous silicon pattern is formed first. A first region, a second region, at least one first pointed region adjacent to the second region and having a second height, at least one fourth region between the first region and each first pointed region are included in the amorphous silicon pattern. Each fourth region has a fourth height smaller than the second height. A laser crystallization process is performed to form a first single crystal silicon grain in each fourth region.
申请公布号 US7014708(B2) 申请公布日期 2006.03.21
申请号 US20040709980 申请日期 2004.06.10
申请人 TOPPOLY OPTOELECTRONICS CORP. 发明人 LIN CHING-WEI
分类号 C30B25/12;C30B13/00;C30B13/24;H01L21/20;H01L21/336;H01L29/786 主分类号 C30B25/12
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