发明名称 Method of forming silicided gate structure
摘要 A method of forming a silicided gate of a field effect transistor on a substrate having active regions is provided. The method includes the following steps: (a) forming a silicide in at least a first portion of a gate; (b) after step (a), depositing a metal over the active regions and said gate; and (c) annealing to cause the metal to react to form silicide in the active regions, wherein the thickness of said gate silicide is greater than the thickness of said silicide in said active regions.
申请公布号 US7015126(B2) 申请公布日期 2006.03.21
申请号 US20040859730 申请日期 2004.06.03
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 WU CHII-MING;LIN CHENG-TUNG;WANG MEI-YUN;CHANG CHIH-WEI;SHUE SHAU-LIN
分类号 H01L21/3205;H01L21/28;H01L21/285;H01L21/336;H01L21/4763;H01L29/49 主分类号 H01L21/3205
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