发明名称 Methods for forming vertical gate transistors providing improved isolation and alignment of vertical gate contacts
摘要 Methods and devices that provide improved isolation and alignment of gate conductors or gate contacts of vertical transistors in deep trench memory cells. A method for forming a vertical gate contact of a vertical transistor includes an oxide spacer formation process that prevents defects, such as shorts caused by voids filled with polysilicon, resulting from etching processes that are performed during fabrication of a vertical transistor, and enables formation of well-defined contact plugs for gate contacts, providing improved alignment structures.
申请公布号 US7015092(B2) 申请公布日期 2006.03.21
申请号 US20030740026 申请日期 2003.12.18
申请人 INFINEON TECHNOLOGIES NORTH AMERICA CORP. 发明人 JAIPRAKASH VENKATACHALAM C.;ARNOLD NORBERT
分类号 H01L21/8242;H01L21/336 主分类号 H01L21/8242
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