PATTERN FOR CONTROLLING CRACK OF SEMICONDUCTOR DEVICES,申请号KR20040073434-传众专利搜索

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发明名称	PATTERN FOR CONTROLLING CRACK OF SEMICONDUCTOR DEVICES
摘要
申请公布号	KR20060024627(A)	申请公布日期	2006.03.17
申请号	KR20040073434	申请日期	2004.09.14
申请人	HYNIX SEMICONDUCTOR INC.	发明人	KIM, YOUNG SEOK
分类号	H01L21/28	主分类号	H01L21/28
代理机构		代理人
主权项
地址

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