| 摘要 |
PROBLEM TO BE SOLVED: To reduce a cost of an inspection apparatus and to reduce an inspection time. SOLUTION: When a quality of a conductor pattern 41 and a conductor pattern 42 which are formed on a circuit board 40 to be inspected, and isolated from each other, is inspected, an AC current I1 is outputted across a pair of parts in the conductor patter 41, and a current value of an electric current passing through the conductor pattern 42 is measured. On the basis of the measured value, the quality of the conductor pattern 41 and the conductor pattern 42 is inspected. COPYRIGHT: (C)2006,JPO&NCIPI
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